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Spatial inhomogeneity of imprint and switching behavior in ferroelectric capacitors
Date Issued
2003-05
Date Available
2014-02-06T11:43:23Z
Abstract
Piezoresponse force microscopy has been used to perform nanoscale characterization of the spatial variations in the imprint and switching behavior of (111)-oriented Pb(Zr,Ti)O-3-based capacitors on Pt electrodes. Mapping of polarization distribution in the poled capacitors as well as local d(33)-V loop measurements revealed a significant difference in imprint and switching behavior between the peripheral and inner parts of the capacitors. It has been found that the inner regions of the capacitors are negatively imprinted (with the preferential direction of the normal component of polarization upward) and tend to switch back after application of the positive poling voltage. On the other hand, switchable regions at the edge of the integrated capacitors generally exhibit more symmetric hysteresis behavior. Application of an ac switching voltage, contrary to what was expected, resulted in an increase of the negatively imprinted regions. The observed effect has been explained by incomplete or asymmetric switching due to the mechanical stress conditions existing in the central parts of the capacitors. (C) 2003 American Institute of Physics.
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Type of Material
Journal Article
Publisher
American Institute of Physics
Journal
Applied Physics Letters
Volume
82
Issue
18
Start Page
3071
End Page
3073
Copyright (Published Version)
2003 American Institute of Physics
Keywords
Language
English
Status of Item
Peer reviewed
This item is made available under a Creative Commons License
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