Repository logo
  • Log In
    New user? Click here to register.Have you forgotten your password?
University College Dublin
    Colleges & Schools
    Statistics
    All of DSpace
  • Log In
    New user? Click here to register.Have you forgotten your password?
  1. Home
  2. Institutes and Centres
  3. Insight Centre for Data Analytics
  4. Insight Research Collection
  5. Measuring optical phase digitally in coherent metrology systems
 
  • Details
Options

Measuring optical phase digitally in coherent metrology systems

Author(s)
Kelly, Damien P.  
Ryle, James P.  
Zhao, Liang  
Sheridan, John T.  
Uri
http://hdl.handle.net/10197/8710
Date Issued
2017-04-09
Date Available
2017-07-31T14:58:29Z
Abstract
The accurate measurement of optical phase has many applications in metrology. For biological samples, which appear transparent, the phase data provides information about the refractive index of the sample. In speckle metrology, the phase can be used to estimate stress and strains of a rough surface with high sensitivity. In this theoretical manuscript we compare and contrast the properties of two techniques for estimating the phase distribution of a wave field under the paraxial approximation: (I) A digital holographic system, and (II) An idealized phase retrieval system. Both systems use a CCD or CMOS array to measure the intensities of the wave fields that are reflected from or transmitted through the sample of interest. This introduces a numerical aspect to the problem. For the two systems above we examine how numerical calculations can limit the performance of these systems leading to a near-infinite number of possible solutions.
Sponsorship
Science Foundation Ireland
Other Sponsorship
Insight Research Centre
Type of Material
Conference Publication
Publisher
Society of Photo-optical Instrumentation Engineers (SPIE)
Journal
in SPIE , Anaheim, California, United States
Volume
Defense + Commercial Sensing
Copyright (Published Version)
2017 Society of Photo-Optical Instrumentation Engineers (SPIE)
Subjects

Personal sensing

Speckle metrology

Phase retrieval

Holography

Statistical optics

Refractive index

Paraxial approximatio...

Metrology

DOI
10.1117/12.2262485
Language
English
Status of Item
Peer reviewed
Journal
Harding, K.G. and Zhang, S. (eds.) Conference Volume 10220: Proc. SPIE 10220 Dimensional Optical Metrology and Inspection for Practical Applications VI
Conference Details
Dimensional Optical Metrology and Inspection for Practical Applications VI, Anaheim, California, United States of America, 9 April 2017
This item is made available under a Creative Commons License
https://creativecommons.org/licenses/by-nc-nd/3.0/ie/
File(s)
Loading...
Thumbnail Image
Name

insight_publication.pdf

Size

1.12 MB

Format

Adobe PDF

Checksum (MD5)

11679c5a0606bf2f8aab53ff7c2af592

Owning collection
Insight Research Collection
Mapped collections
Electrical and Electronic Engineering Research Collection•
Solar Energy Conversion (SEC) Cluster Research Collection

Item descriptive metadata is released under a CC-0 (public domain) license: https://creativecommons.org/public-domain/cc0/.
All other content is subject to copyright.

For all queries please contact research.repository@ucd.ie.

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science

  • Cookie settings
  • Privacy policy
  • End User Agreement