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  5. Thickness variation of self-processing acrylamide-based photopolymer and reflection holography
 
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Thickness variation of self-processing acrylamide-based photopolymer and reflection holography

Author(s)
O'Neill, Feidhlim T.  
Lawrence, Justin R.  
Sheridan, John T.  
Uri
http://hdl.handle.net/10197/3417
Date Issued
2001-04
Date Available
2012-01-05T14:32:29Z
Abstract
There are many types of holographic recording material. The acrylamide-based recording material examined here has one significant
advantage: it is self-processing. This simplifies the recording process and enables holographic interferometry to be carried out without the need for complex realignment procedures. However, the effect that the
polymerization process has on the grating thickness must be examined. This question is fundamental to the material’s use in holographic optical elements, as thickness variations affect the replay conditions of the produced elements. This paper presents a study of this thickness variation and reports for the first time the production of reflection holographic gratings in this material.
Sponsorship
Other funder
Other Sponsorship
D.I.T. Scholarship IV and Strategic Research and Development VII funding programs
Type of Material
Journal Article
Publisher
Society of Photo-Optical Instrumentation Engineers
Journal
Optical Engineering
Volume
40
Issue
4
Start Page
533
End Page
539
Copyright (Published Version)
2001 Society of Photo-Optical Instrumentation Engineers
Subjects

Holographic recording...

Nondestructive testin...

Holographic optical e...

Reflection holography

Photopolymer

Holography

Subject – LCSH
Holographic storage devices (Computer science)
Nondestructive testing
Holography
Photopolymers
DOI
10.1117/1.1353801
Web versions
http://dx.doi.org/10.1117/1.1353801
Language
English
Status of Item
Not peer reviewed
ISSN
00913286
This item is made available under a Creative Commons License
https://creativecommons.org/licenses/by-nc-sa/1.0/
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Checksum (MD5)

7ce9bc04adcd37e4fa8622e7411591a6

Owning collection
Electrical and Electronic Engineering Research Collection

Item descriptive metadata is released under a CC-0 (public domain) license: https://creativecommons.org/public-domain/cc0/.
All other content is subject to copyright.

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