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  5. Key-space analysis of double random phase encryption technique
 
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Key-space analysis of double random phase encryption technique

Author(s)
Monaghan, David S.  
Gopinathan, Unnikrishnan  
Naughton, Thomas J.  
Sheridan, John T.  
Uri
http://hdl.handle.net/10197/3356
Date Issued
2007-09-10
Date Available
2011-11-28T16:37:52Z
Abstract
We perform a numerical analysis on the double random phase encryption/decryption technique. The key-space of an encryption technique is the set of possible keys that can be used to encode data using that
technique. In the case of a strong encryption scheme, many keys must be tried in any brute-force attack on that technique. Traditionally, designers of optical image encryption systems demonstrate only how a
small number of arbitrary keys cannot decrypt a chosen encrypted image in their system. However, this type of demonstration does not discuss the properties of the key-space nor refute the feasibility of an
efficient brute-force attack. To clarify these issues we present a key-space analysis of the technique. For a range of problem instances we plot the distribution of decryption errors in the key-space indicating the lack of feasibility of a simple brute-force attack.
Sponsorship
Science Foundation Ireland
Irish Research Council for Science, Engineering and Technology
Other Sponsorship
Enterprise Ireland
Type of Material
Journal Article
Publisher
Optical Society of America
Journal
Applied Optics
Volume
46
Issue
26
Start Page
6641
End Page
6647
Copyright (Published Version)
2007 Optical Society of America
Subject – LCSH
Data encryption (Computer science)
Numerical analysis
Image processing--Digital techniques
DOI
10.1364/AO.46.006641
Web versions
http://dx.doi.org/10.1364/AO.46.006641
Language
English
Status of Item
Not peer reviewed
ISSN
0003-6935 (print)
1539-4522 (online)
This item is made available under a Creative Commons License
https://creativecommons.org/licenses/by-nc-sa/1.0/
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Key-space analysis of double random phase encryption.pdf

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Owning collection
Electrical and Electronic Engineering Research Collection

Item descriptive metadata is released under a CC-0 (public domain) license: https://creativecommons.org/public-domain/cc0/.
All other content is subject to copyright.

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