Analytical View on Non-Invasive Measurement of Moving Charge by Position Dependent Semiconductor Qubit

Alternative Title
Analytical view on non-invasive measurement of moving charge by various topologies of position-based semiconductor qubit
Author(s)
Uri
Date Issued
2020-11-01
Date Available
2024-02-12T17:22:47Z
Embargo end date
2021-11-01
Abstract
Detection of moving charge in free space is presented in the framework of single electron CMOS devices. It opens the perspective for construction of new type detectors for beam diagnostic in accelerators. General phenomenological model of noise acting on position based qubit implemented in semiconductor quantum dots is given in the framework of simplistic tight-binding model.
Sponsorship
Science Foundation Ireland
Other Sponsorship
Insight Research Centre
Type of Material
Conference Publication
Publisher
Springer
Series
Advances in Intelligent Systems and Computing
1289
Copyright (Published Version)
2021 Springer
Subjects

Linked data

Moving charge

Position-based qubit ...

DOI
Language
English
Status of Item
Peer reviewed
Journal
Arai K., Kapoor, S., Bhatia, R. (eds.). Proceedings of the Future Technologies Conference (FTC) 2020: Volume 2
ISBN
978-3-030-63088-1
This item is made available under a Creative Commons License
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Analytical view on non-invasive measurement of moving charge by various topologies of position-based semiconductor qubit.pdf

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Owning collection
Insight Research Collection
Mapped collections
Computer Science Research Collection