Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques
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|Title:||Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques||Authors:||Kilpatrick, Jason I.
Weber, Stefan A. L.
Rodriguez, Brian J.
|Permanent link:||http://hdl.handle.net/10197/10145||Date:||28-Dec-2018||Online since:||2019-04-25T07:35:28Z||Abstract:||Kelvin probe force microscopy (KPFM) is a widely used technique to map surface potentials at the nanometer scale. In traditional KPFM, a feedback loop regulates the DC bias applied between a sharp conductive probe and a sample to nullify the electrostatic force (closed-loop operation). In comparison, open-loop techniques such as dual harmonic KPFM (DH-KPFM) are simpler to implement, are less sensitive to artefacts, offer the unique ability to probe voltage sensitive materials, and operate in liquid environments. Here, we directly compare the two techniques in terms of their bandwidth and sensitivity to instrumentation artefacts. Furthermore, we introduce a new correction for traditional KPFM termed “setpoint correction,” which allows us to obtain agreement between open and closed-loop techniques within 1%. Quantitative validation of DH-KPFM may lead to a wider adoption of open-loop KPFM techniques by the scanning probe community.||Funding Details:||Science Foundation Ireland
University College Dublin
|Type of material:||Journal Article||Publisher:||AIP Publishing||Journal:||Review of Scientific Instruments||Volume:||89||Issue:||12||Start page:||123708||Copyright (published version):||2018 the Authors||Keywords:||Kelvin probe force microscopy; Nanometer scale; Dielectric properties; Electrical properties and parameters; Electrostatics||DOI:||10.1063/1.5025432||Language:||en||Status of Item:||Peer reviewed|
|Appears in Collections:||Conway Institute Research Collection|
Physics Research Collection
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