Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques

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Title: Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques
Authors: Kilpatrick, Jason I.
Collins, Liam
Weber, Stefan A. L.
Rodriguez, Brian J.
Permanent link: http://hdl.handle.net/10197/10145
Date: 28-Dec-2018
Online since: 2019-04-25T07:35:28Z
Abstract: Kelvin probe force microscopy (KPFM) is a widely used technique to map surface potentials at the nanometer scale. In traditional KPFM, a feedback loop regulates the DC bias applied between a sharp conductive probe and a sample to nullify the electrostatic force (closed-loop operation). In comparison, open-loop techniques such as dual harmonic KPFM (DH-KPFM) are simpler to implement, are less sensitive to artefacts, offer the unique ability to probe voltage sensitive materials, and operate in liquid environments. Here, we directly compare the two techniques in terms of their bandwidth and sensitivity to instrumentation artefacts. Furthermore, we introduce a new correction for traditional KPFM termed “setpoint correction,” which allows us to obtain agreement between open and closed-loop techniques within 1%. Quantitative validation of DH-KPFM may lead to a wider adoption of open-loop KPFM techniques by the scanning probe community.
Funding Details: Science Foundation Ireland
University College Dublin
Type of material: Journal Article
Publisher: AIP Publishing
Journal: Review of Scientific Instruments
Volume: 89
Issue: 12
Start page: 123708
Copyright (published version): 2018 the Authors
Keywords: Kelvin probe force microscopyNanometer scaleDielectric propertiesElectrical properties and parametersElectrostatics
DOI: 10.1063/1.5025432
Language: en
Status of Item: Peer reviewed
Appears in Collections:Conway Institute Research Collection
Physics Research Collection

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