Digital Suppression of Transmitter Leakage in FDD RF Transceivers: Aliasing Elimination and Model Selection
|Title:||Digital Suppression of Transmitter Leakage in FDD RF Transceivers: Aliasing Elimination and Model Selection||Authors:||Cao, Wenhui
|Permanent link:||http://hdl.handle.net/10197/10381||Date:||7-Dec-2017||Online since:||2019-05-09T10:10:28Z||Abstract:||The transmitter (TX)-induced interference due to power amplifier nonlinearities poses severe desensitization problems to the receiver chain in frequency-division duplexing transceivers. Due to nonlinear signal process involved, a high sampling rate is normally required in the existing digital suppression approaches, which can result in high cost and high power consumption in wideband systems. In this paper, a new digital suppression model is proposed to cancel the TX leakage at baseband with a low sampling rate. The cancellation model is based on the modified decomposed vector rotation model. With the addition of cross-Term products, the enhanced model is capable of eliminating the aliasing effect arising from the reduced sampling rate. Theoretical analysis of aliasing elimination is presented, and the algorithm is subsequently verified by both simulation and experiment results, confirming the effectiveness and feasibility of the proposed cancellation technique for TX leakage suppression. Compared with conventional solutions, the new approach uses much less hardware resource and consumes much lower power while achieving comparable performance.||Funding Details:||Science Foundation Ireland||Type of material:||Journal Article||Publisher:||IEEE||Journal:||IEEE Transactions on Microwave Theory and Techniques||Volume:||66||Issue:||3||Start page:||1500||End page:||1511||Copyright (published version):||2017 IEEE||Keywords:||Aliasing effect; Aliasing elimination; Behavioral model; Cross terms; Frequency-division duplexing (FDD); Leakage suppression; Low sampling rate; Transceiver||DOI:||10.1109/TMTT.2017.2772789||Language:||en||Status of Item:||Peer reviewed|
|Appears in Collections:||Electrical and Electronic Engineering Research Collection|
Show full item record
This item is available under the Attribution-NonCommercial-NoDerivs 3.0 Ireland. No item may be reproduced for commercial purposes. For other possible restrictions on use please refer to the publisher's URL where this is made available, or to notes contained in the item itself. Other terms may apply.