Digital Suppression of Transmitter Leakage in FDD RF Transceivers: Aliasing Elimination and Model Selection

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Title: Digital Suppression of Transmitter Leakage in FDD RF Transceivers: Aliasing Elimination and Model Selection
Authors: Cao, Wenhui
Li, Yue
Zhu, Anding
Permanent link: http://hdl.handle.net/10197/10381
Date: 7-Dec-2017
Online since: 2019-05-09T10:10:28Z
Abstract: The transmitter (TX)-induced interference due to power amplifier nonlinearities poses severe desensitization problems to the receiver chain in frequency-division duplexing transceivers. Due to nonlinear signal process involved, a high sampling rate is normally required in the existing digital suppression approaches, which can result in high cost and high power consumption in wideband systems. In this paper, a new digital suppression model is proposed to cancel the TX leakage at baseband with a low sampling rate. The cancellation model is based on the modified decomposed vector rotation model. With the addition of cross-Term products, the enhanced model is capable of eliminating the aliasing effect arising from the reduced sampling rate. Theoretical analysis of aliasing elimination is presented, and the algorithm is subsequently verified by both simulation and experiment results, confirming the effectiveness and feasibility of the proposed cancellation technique for TX leakage suppression. Compared with conventional solutions, the new approach uses much less hardware resource and consumes much lower power while achieving comparable performance.
Funding Details: Science Foundation Ireland
Type of material: Journal Article
Publisher: IEEE
Journal: IEEE Transactions on Microwave Theory and Techniques
Volume: 66
Issue: 3
Start page: 1500
End page: 1511
Copyright (published version): 2017 IEEE
Keywords: Aliasing effectAliasing eliminationBehavioral modelCross termsFrequency-division duplexing (FDD)Leakage suppressionLow sampling rateTransceiver
DOI: 10.1109/TMTT.2017.2772789
Language: en
Status of Item: Peer reviewed
Appears in Collections:Electrical and Electronic Engineering Research Collection

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