PIT-HOM: an Extension of Pitest for Higher Order Mutation Analysis

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Title: PIT-HOM: an Extension of Pitest for Higher Order Mutation Analysis
Authors: Laurent, ThomasVentresque, Anthony
Permanent link: http://hdl.handle.net/10197/10923
Date: 23-Apr-2019
Online since: 2019-07-18T10:39:51Z
Abstract: Mutation testing is a well-known, effective, fault-based testing criterion. First order mutation introduces defects in the form of a single small syntactic change. While the technique has been shown to be effective, it has some limits. Higher order mutation, where the faults introduced include multiple changes, has been proposed as a way to address some of these limits. Although the technique has shown promising results, there is no practical tool available for the application and study of higher order mutation on Java programs. In this paper we present PIT-HOM, an extension of Pitest (PIT) for higher order mutation. Pitest is a practical mutation analysis tool for Java, applicable on real-world codebases. PIT-HOM combines mutants in a same class to create higher order mutants of user-defined orders, it runs the mutants and reports the results in an easy to process format. We validate PIT-HOM using two small Java programs and report its performance as well as some characteristics of the mutants it creates.
Funding Details: European Commission - European Regional Development Fund
Irish Research Council
Science Foundation Ireland
Type of material: Conference Publication
Publisher: IEEE
Start page: 83
End page: 89
Copyright (published version): 2019 IEEE
Keywords: Mutation analysisToolHigher order mutationPitest
DOI: 10.1109/icstw.2019.00036
Other versions: http://icst2019.xjtu.edu.cn/
Language: en
Status of Item: Not peer reviewed
Is part of: 2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
Conference Details: ICST 2019: 12th IEEE International Conference on Software Testing, Verification and Validation, Xi'an, China, April 22-27 2019
Appears in Collections:Computer Science Research Collection

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