Intuitive Understanding of Flicker Noise Reduction via Narrowing of Conduction Angle in Voltage-Biased Oscillators

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Title: Intuitive Understanding of Flicker Noise Reduction via Narrowing of Conduction Angle in Voltage-Biased Oscillators
Authors: Hu, YizheSiriburanon, TeerachotStaszewski, Robert Bogdan
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Date: 30-Jan-2019
Online since: 2019-08-26T13:14:28Z
Abstract: This brief aims to intuitively explain and numeri- cally verify the observed phenomenon of flicker noise reduction in oscillators of reduced conduction angle (i.e., in class-C), which has been presented in literature but never properly explained. The flicker phase noise in a voltage-biased oscillator capable of operating in class-B and class-C is compared and numerically verified using a commercial simulation model of TSMC 28-nm CMOS. We illustrate how narrowing the conduction angle can suppress the 1/f noise up-conversion by decreasing 1/f noise exposure to the asymmetric rising and falling edges of oscillation waveform. The effects of implicit common-mode tank in the class- C operation is also discussed. We further clarify ambiguities among several simulation methods of impulse sensitivity function (ISF) based on periodic small-signal analysis (PAC or PXF), which is a key tool in understanding the flicker noise up- conversion. A clearer ISF simulation method based on positive sidebands of PXF is proposed.
Funding Details: European Commission
European Commission - Seventh Framework Programme (FP7)
Science Foundation Ireland
Type of material: Journal Article
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Journal: IEEE Transactions on Circuits and Systems II: Express Briefs
Volume: 66
Issue: 12
Start page: 1962
End page: 1966
Copyright (published version): 2019 IEEE
Keywords: Class-C oscillatorFlicker noise up-conversionImpulse sensitivity function (ISF)Periodic transfer function (PXF) analysisPeriodic AC (PAC) analysisSpectreRF
DOI: 10.1109/tcsii.2019.2896483
Language: en
Status of Item: Peer reviewed
Appears in Collections:Electrical and Electronic Engineering Research Collection

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