A Generic Foreground Calibration Algorithm for ADCs with Nonlinear Impairments
|Title:||A Generic Foreground Calibration Algorithm for ADCs with Nonlinear Impairments||Authors:||Salib, Armia; Flanagan, Mark F.; Cardiff, Barry||Permanent link:||http://hdl.handle.net/10197/11128||Date:||30-May-2018||Online since:||2019-10-08T14:07:32Z||Abstract:||This paper presents a generic foreground calibration algorithm which compensates for memoryless nonlinear impairments in pipeline, SAR or hybrid ADC architectures. Amplifier nonlinearity, comparator offsets, capacitance mismatch and settling time errors are considered. During the calibration process, each element of a look up table is computed by mapping each raw ADC output value to an estimate of the corresponding input, and the most likely input corresponding to each raw ADC output is computed and stored in the table; this table is then used during normal operation to map the raw values to the calibrated ADC outputs. Complexity reduction techniques are presented to facilitate an in-circuit hardware implementation in order to reduce foreground calibration time. The algorithm's performance is evaluated using a SAR ADC model suffering from various nonlinear impairments. Results are presented for settling time errors, capacitor mismatch scenarios, and a wide range of nonlinear amplifier parameters, demonstrating a significant performance improvement in all cases.||Funding Details:||European Commission - European Regional Development Fund
Science Foundation Ireland
|Type of material:||Conference Publication||Publisher:||IEEE||Copyright (published version):||2018 IEEE||Keywords:||ADC; Transfer function; Calibration; Nonlinearity||DOI:||10.1109/ISCAS.2018.8351187||Language:||en||Status of Item:||Peer reviewed||Is part of:||2018 IEEE International Symposium on Circuits and Systems (ISCAS), 27-30 May 2018, Florence, Italy: Proceedings||Conference Details:||The 2018 IEEE International Symposium on Circuits and Systems (ISCAS), Florence, Italy, 27-30 May 2018||ISBN:||9781538648810|
|Appears in Collections:||Electrical and Electronic Engineering Research Collection|
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