A Generic Foreground Calibration Algorithm for ADCs with Nonlinear Impairments
|Title:||A Generic Foreground Calibration Algorithm for ADCs with Nonlinear Impairments||Authors:||Salib, Armia; Flanagan, Mark F.; Cardiff, Barry||Permanent link:||http://hdl.handle.net/10197/11129||Date:||May-2018||Online since:||2019-10-08T14:20:53Z||Abstract:||This paper presents a generic foreground calibration algorithm that estimates and corrects memoryless nonlinear impairments in both single channel and time-interleaved analog-to-digital converters (TIADCs), and which is capable of correcting for amplifier nonlinearity, comparator offsets, and capacitance mismatch for each channel. It operates by generating, and then using, a look-up table which maps raw ADC output decision vectors to linearized output. For TIADCs, the algorithm also uses information gained during the calibration phase to estimate timing and gain mismatches among the sub-ADCs. The problem of selecting an appropriate timing reference so as to relax the requirements on the time-skew correction circuitry is statistically analyzed, as is the corresponding impact on manufacturing yield. Accordingly, a new method is proposed having superior performance; for example, in the case of an eight sub-ADC TIADC system, the proposed scheme reduces the time skew correction requirement by 44% compared with conventional methods. The architecture is instrumented with some additional circuitry to facilitate built-in self-test, allowing manufacturing test time and cost reductions. Implementation aspects are discussed, and several complexity reduction techniques are presented along with synthesis results from a Verilog implementation of the calibration engine.||Funding Details:||European Commission Horizon 2020
Science Foundation Ireland
|Type of material:||Journal Article||Publisher:||IEEE||Journal:||IEEE Transactions on Circuits and Systems I: Regular Papers||Volume:||66||Issue:||5||Start page:||1874||End page:||1885||Copyright (published version):||2018 IEEE||Keywords:||ADC; Transfer function; Foreground; Calibration; Nonlinearity; TIADC; BIST; Bandwidth mismatch||DOI:||10.1109/TCSI.2018.2870529||Language:||en||Status of Item:||Peer reviewed|
|Appears in Collections:||Electrical and Electronic Engineering Research Collection|
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