Coherent imaging of periodic thick fine isolated structures
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|Title:||Coherent imaging of periodic thick fine isolated structures||Authors:||Sheridan, John T.
|Permanent link:||http://hdl.handle.net/10197/3288||Date:||1-Apr-1993||Online since:||2011-11-03T15:21:05Z||Abstract:||The diffraction orders and coherent bright and dark field images produced by isolated steps and grooves (notches and trenches) are examined. The isolated structures are approximated by means of a grating with a large period that contains small, widely separated, lamellar structures. The rigorous modal method for TE polarized incident light is used for the numerical calculations. Structures in two types of dielectric material, refractive index n = 1.5 and n = 4.0, are discussed. The images are examined for variations with several parameters, including width and thickness of the structure and focus position. Several approximate methods for calculating these images, based on first-order approximations, are suggested.||Funding Details:||Other funder||Type of material:||Journal Article||Publisher:||Optical Society of America||Journal:||Journal of the Optical Society of America A||Volume:||10||Issue:||4||Start page:||614||End page:||632||Copyright (published version):||1993 Optical Society of America||Subject LCSH:||Dielectrics
|DOI:||10.1364/JOSAA.10.000614||Other versions:||http://dx.doi.org/10.1364/JOSAA.10.000614||Language:||en||Status of Item:||Not peer reviewed|
|Appears in Collections:||Electrical and Electronic Engineering Research Collection|
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