Paraxial speckle-based metrology systems with an aperture

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Title: Paraxial speckle-based metrology systems with an aperture
Authors: Kelly, Damien P.
Ward, Jennifer E.
Hennelly, Bryan M.
Gopinathan, Unnikrishnan
O'Neill, Feidhlim T.
Sheridan, John T.
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Date: 1-Nov-2006
Abstract: Digital speckle photography can be used in the analysis of surface motion in combination with an optical linear canonical transform (LCT). Previously [D. P. Kelly et al. Appl. Opt. 44, 2720 (2005)] it has been shown that optical fractional Fourier transforms (OFRTs) can be used to vary the range and sensitivity of speckle-based metrology systems, allowing the measurement of both the magnitude and direction of tilting (rotation) and translation motion simultaneously, provided that the motion is captured in two separate OFRT domains. This requires two bulk optical systems. We extend the OFRT analysis to more general LCT systems with a single limiting aperture. The effect of a limiting aperture in LCT systems is examined in more detail by deriving a generalized Yamaguchi correlation factor. We demonstrate the benefits of using an LCT approach to metrology design. Using this technique, we show that by varying the curvature of the illuminating field, we can effectively change the output domain. From a practical perspective this means that estimation of the motion of a target can be achieved by using one bulk optical system and different illuminating conditions. Experimental results are provided to support our theoretical analysis.
Funding Details: Science Foundation Ireland
Irish Research Council for Science, Engineering and Technology
Other funder
Type of material: Journal Article
Publisher: Optical Society of America
Journal: Journal of the Optical Society of America A
Volume: 23
Issue: 11
Start page: 2861
End page: 2870
Copyright (published version): 2006 Optical Society of America
Subject LCSH: Speckle
Fourier transform optics
Contact transformations
Signal processing
DOI: 10.1364/JOSAA.23.002861
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Language: en
Status of Item: Not peer reviewed
Appears in Collections:Electrical and Electronic Engineering Research Collection

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