Mapping bias-induced phase stability and random fields in relaxor ferroelectrics

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Title: Mapping bias-induced phase stability and random fields in relaxor ferroelectrics
Authors: Rodriguez, Brian J.
Jesse, S.
Bokov, A. A.
Ye, Z. -G.
Kalinin, S. V.
Permanent link: http://hdl.handle.net/10197/5191
Date: Sep-2009
Abstract: The spatial variability of polarization reversal behavior in the relaxor 0.9Pb(Mg1/3Nb2/3O3)-0.1PbTiO(3) crystal, is revealed on the similar to 100 nm scale using switching spectroscopy piezoresponse force microscopy. Quenched fields conjugate to polarization are found, which show mesoscopic (similar to 100-200 nm) spatial fluctuations around near-zero bias values. The mapping of the stability gap of the bias-induced phase and conjugate random fields is demonstrated. The origin of the observed nanoscale domains and the field-induced part of the polarization are discussed.
Funding Details: Other funder
Type of material: Journal Article
Publisher: AIP Publishing
Copyright (published version): 2009 American Institute of Physics
Keywords: Polarization;Switching spectroscopy piezoresponse force microscopy;Nanoscale domains;Spatial variation
DOI: 10.1063/1.3222868
Language: en
Status of Item: Peer reviewed
Appears in Collections:Physics Research Collection

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