Imaging mechanism of piezoresponse force microscopy in capacitor structures

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Title: Imaging mechanism of piezoresponse force microscopy in capacitor structures
Authors: Kalinin, S. V.
Rodriguez, Brian J.
Kim, Seung-Hyun
et al.
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Date: 18-Apr-2008
Online since: 2013-12-19T09:50:04Z
Abstract: The image formation mechanism in piezoresponse force microscopy (PFM) of capacitor structures is analyzed. We demonstrate that the spatial resolution is a bilinear function of film and top electrode thicknesses and derive the corresponding analytical expressions. For many perovskites, the opposite contributions of d(31) and d(33) components can result in anomalous domain wall profiles. This analysis establishes the applicability limits of PFM for polarization dynamics studies in capacitors and applies them to other structural probes, including focused x-ray studies of capacitor structures. (c) 2008 American Institute of Physics.
Type of material: Journal Article
Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 92
Issue: 15
Start page: 152906
Copyright (published version): 2008 American Institute of Physics
Keywords: Piezoresponse force microscopy
DOI: 10.1063/1.2905266
Language: en
Status of Item: Peer reviewed
Appears in Collections:Physics Research Collection

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