Imaging mechanism of piezoresponse force microscopy in capacitor structures

DC FieldValueLanguage
dc.contributor.authorKalinin, S. V.-
dc.contributor.authorRodriguez, Brian J.-
dc.contributor.authorKim, Seung-Hyun-
dc.contributor.authoret al.-
dc.date.accessioned2013-12-19T09:50:04Z-
dc.date.available2013-12-19T09:50:04Z-
dc.date.copyright2008 American Institute of Physicsen
dc.date.issued2008-04-18-
dc.identifier.citationApplied Physics Lettersen
dc.identifier.urihttp://hdl.handle.net/10197/5202-
dc.description.abstractThe image formation mechanism in piezoresponse force microscopy (PFM) of capacitor structures is analyzed. We demonstrate that the spatial resolution is a bilinear function of film and top electrode thicknesses and derive the corresponding analytical expressions. For many perovskites, the opposite contributions of d(31) and d(33) components can result in anomalous domain wall profiles. This analysis establishes the applicability limits of PFM for polarization dynamics studies in capacitors and applies them to other structural probes, including focused x-ray studies of capacitor structures. (c) 2008 American Institute of Physics.en
dc.language.isoenen
dc.publisherAmerican Institute of Physicsen
dc.rightsThe following article appeared in Applied Physics Letters, 92 (15) :152906 and may be found at http://link.aip.org/link/doi/10.1063/1.2905266. The article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en
dc.subjectPiezoresponse force microscopyen
dc.titleImaging mechanism of piezoresponse force microscopy in capacitor structuresen
dc.typeJournal Articleen
dc.internal.authorcontactotherbrian.rodriguez@ucd.ie-
dc.internal.availabilityFull text availableen
dc.statusPeer revieweden
dc.identifier.volume92en
dc.identifier.issue15en
dc.identifier.startpage152906en
dc.identifier.doi10.1063/1.2905266-
dc.neeo.contributorKalinin|S. V.|aut|-
dc.neeo.contributorRodriguez|Brian J.|aut|-
dc.neeo.contributorKim|Seung-Hyun|aut|-
dc.neeo.contributoret al.||aut|-
dc.description.adminAuthor has checked copyrighten
dc.description.admin12/12/2013. SB.en
dc.internal.rmsid130173968-
dc.date.updated2013-11-22T15:59:03Z-
item.grantfulltextopen-
item.fulltextWith Fulltext-
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