Probing intrinsic polarization properties in bismuth-layered ferroelectric films
Files in This Item:
|Watanabe_et_al_Appl_Phys_Lett_2007.pdf||494.4 kB||Adobe PDF||Download|
|Title:||Probing intrinsic polarization properties in bismuth-layered ferroelectric films||Authors:||Watanabe, Takayuki
Rodriguez, Brian J.
|Permanent link:||http://hdl.handle.net/10197/5225||Date:||16-Mar-2007||Online since:||2014-01-09T10:07:55Z||Abstract:||The authors report on an approach to establish intrinsic polarization properties in bismuth-layered ferroelectric films by piezoelectric coefficient and soft-mode spectroscopy, as well as by a direct polarization-electric field hysteresis. In epitaxially grown (Bi4−xNdx)Ti3O12 (0⩽x⩽0.73)films, they show that these complementary characterizations can phenomenologically and thermodynamically represent the intrinsic polarization states in (Bi4−xNdx)Ti3O12films, and the intrinsic Ps of 67μC/cm2 is estimated for pure Bi4Ti3O12, superior to 50μC/cm2 in bulk single crystal. Their results provide a pathway to draw full potential in ferroelectric thin films.||Type of material:||Journal Article||Publisher:||American Institute of Physics||Journal:||Applied Physics Letters||Volume:||90||Issue:||11||Start page:||112914||Copyright (published version):||2007, American Institute of Physics||Keywords:||Piezoelectric coefficient; Soft-mode spectroscopy; Polarization states||DOI:||10.1063/1.2713858||Language:||en||Status of Item:||Peer reviewed|
|Appears in Collections:||Physics Research Collection|
Show full item record
Page view(s) 5053
This item is available under the Attribution-NonCommercial-NoDerivs 3.0 Ireland. No item may be reproduced for commercial purposes. For other possible restrictions on use please refer to the publisher's URL where this is made available, or to notes contained in the item itself. Other terms may apply.