Probing intrinsic polarization properties in bismuth-layered ferroelectric films
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|Title:||Probing intrinsic polarization properties in bismuth-layered ferroelectric films||Authors:||Watanabe, Takayuki
Rodriguez, Brian J.
|Permanent link:||http://hdl.handle.net/10197/5225||Date:||16-Mar-2007||Abstract:||The authors report on an approach to establish intrinsic polarization properties in bismuth-layered ferroelectric films by piezoelectric coefficient and soft-mode spectroscopy, as well as by a direct polarization-electric field hysteresis. In epitaxially grown (Bi4−xNdx)Ti3O12 (0⩽x⩽0.73)films, they show that these complementary characterizations can phenomenologically and thermodynamically represent the intrinsic polarization states in (Bi4−xNdx)Ti3O12films, and the intrinsic Ps of 67μC/cm2 is estimated for pure Bi4Ti3O12, superior to 50μC/cm2 in bulk single crystal. Their results provide a pathway to draw full potential in ferroelectric thin films.||Type of material:||Journal Article||Publisher:||American Institute of Physics||Copyright (published version):||2007, American Institute of Physics||Keywords:||Piezoelectric coefficient;Soft-mode spectroscopy;Polarization states||DOI:||10.1063/1.2713858||Language:||en||Status of Item:||Peer reviewed|
|Appears in Collections:||Physics Research Collection|
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