Probing intrinsic polarization properties in bismuth-layered ferroelectric films

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Title: Probing intrinsic polarization properties in bismuth-layered ferroelectric films
Authors: Watanabe, Takayuki
Funakubo, Hiroshi
Osada, Minoru
Rodriguez, Brian J.
et al.
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Date: 16-Mar-2007
Online since: 2014-01-09T10:07:55Z
Abstract: The authors report on an approach to establish intrinsic polarization properties in bismuth-layered ferroelectric films by piezoelectric coefficient and soft-mode spectroscopy, as well as by a direct polarization-electric field hysteresis. In epitaxially grown (Bi4−xNdx)Ti3O12 (0⩽x⩽0.73)films, they show that these complementary characterizations can phenomenologically and thermodynamically represent the intrinsic polarization states in (Bi4−xNdx)Ti3O12films, and the intrinsic Ps of 67μC/cm2 is estimated for pure Bi4Ti3O12, superior to 50μC/cm2 in bulk single crystal. Their results provide a pathway to draw full potential in ferroelectric thin films.
Type of material: Journal Article
Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 90
Issue: 11
Start page: 112914
Copyright (published version): 2007, American Institute of Physics
Keywords: Piezoelectric coefficientSoft-mode spectroscopyPolarization states
DOI: 10.1063/1.2713858
Language: en
Status of Item: Peer reviewed
Appears in Collections:Physics Research Collection

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