Simultaneous elastic and electromechanical imaging by scanning probe microscopy: Theory and applications to ferroelectric and biological materials

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Title: Simultaneous elastic and electromechanical imaging by scanning probe microscopy: Theory and applications to ferroelectric and biological materials
Authors: Shin, J.
Rodriguez, Brian J.
Baddorf, A. P.
et al.
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Date: Sep-2005
Online since: 2014-01-30T16:14:37Z
Abstract: An approach for combined imaging of elastic and electromechanical properties of materials, referred to as piezoacoustic scanning probe microscopy (PA-SPM), is presented. Applicability of this technique for elastic and electromechanical imaging with nanoscale resolution in such dissimilar materials as ferroelectrics and biological tissues is demonstrated. The PA-SPM signal formation is analyzed based on the theory of nanoelectromechanics of piezoelectric indentation and signal sensitivity to materials properties and imaging conditions. It is shown that simultaneous measurements of local indentation stiffness and indentation piezocoefficient provide the most complete description of the local electroelastic properties for transversally isotropic materials, thus making piezoacoustic SPM a comprehensive imaging and analysis tool. The contrast formation mechanism in the low frequency regime is described in terms of tip-surface contact mechanics. Signal generation volumes for electromechanical and elastic signals are determined and relative sensitivity of piezoresponse force microscopy (PFM) and atomic force acoustic microscopy (AFAM) for topographic cross-talk is established. (c) 2005 American Vacuum Society.
Type of material: Journal Article
Publisher: American Vacuum Society
Journal: Journal of Vacuum Science & Technology B
Volume: 23
Issue: 5
Start page: 2102
End page: 2108
Copyright (published version): 2005 American Vacuum Society
Keywords: Piezoacoustic scanning probe microscopyElastic imagingLocal indentation stiffnessIndentation piezocoefficientElectroelastic propertiesTransversally isotropic materials
DOI: 10.1116/1.2052714
Language: en
Status of Item: Peer reviewed
Appears in Collections:Physics Research Collection

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