High Resolution Electromechanical Imaging of Ferroelectric Materials in a Liquid Environment by Piezoresponse Force Microscopy

DC FieldValueLanguage
dc.contributor.authorRodriguez, Brian J.
dc.contributor.authorJesse, S.
dc.contributor.authorBaddorf, A. P.
dc.contributor.authorKalinin, S. V.
dc.date.accessioned2014-01-31T09:55:04Z
dc.date.available2014-01-31T09:55:04Z
dc.date.copyright2006 American Phyiscal Societyen
dc.date.issued2006-06
dc.identifier.citationPhysical Review Lettersen
dc.identifier.urihttp://hdl.handle.net/10197/5338
dc.description.abstractHigh-resolution imaging of ferroelectric materials using piezoresponse force microscopy (PFM) is demonstrated in an aqueous environment. The elimination of both long-range electrostatic forces and capillary interactions results in a localization of the ac field to the tip-surface junction and allows the tip-surface contact area to be controlled. This approach results in spatial resolutions approaching the limit of the intrinsic domain-wall width. Imaging at frequencies corresponding to high-order cantilever resonances minimizes the viscous damping and added mass effects on cantilever dynamics and allows sensitivities comparable to ambient conditions. PFM in liquids will provide novel opportunities for high-resolution studies of ferroelectric materials, imaging of soft polymer materials, and imaging of biological systems in physiological environments on, ultimately, the molecular level.en
dc.language.isoenen
dc.publisherAmerican Phyiscal Societyen
dc.subjectPiezoresponse force microscopy
dc.subjectElectrostatic forces
dc.subjectCapillary interactions
dc.subjectCantilever resonances
dc.subjectPolymer materials
dc.titleHigh Resolution Electromechanical Imaging of Ferroelectric Materials in a Liquid Environment by Piezoresponse Force Microscopyen
dc.typeJournal Articleen
dc.internal.authorcontactotherbrian.rodriguez@ucd.ie
dc.internal.availabilityFull text availableen
dc.statusPeer revieweden
dc.identifier.volume96en
dc.identifier.issue23en
dc.identifier.startpage2376021en
dc.identifier.endpage2376024en
dc.identifier.doi10.1103/PhysRevLett.96.237602-
dc.neeo.contributorRodriguez|Brian J.|aut|-
dc.neeo.contributorJesse|S.|aut|-
dc.neeo.contributorBaddorf|A. P.|aut|-
dc.neeo.contributorKalinin|S. V.|aut|-
dc.description.adminAuthor has checked copyrighten
dc.description.adminAMSen
dc.internal.rmsid130173993
dc.date.updated2013-11-26T13:43:18Z
item.grantfulltextopen-
item.fulltextWith Fulltext-
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