Scanning probe investigation of surface charge and surface potential of GaN-based heterostructures

Files in This Item:
File Description SizeFormat 
Rodriguez_et_al_Appl_Phys_Lett_2005_GaN.pdf235.49 kBAdobe PDFDownload
Title: Scanning probe investigation of surface charge and surface potential of GaN-based heterostructures
Authors: Rodriguez, Brian J.
Yang, W. -C.
Nemanich, R. J.
Gruverman, A.
Permanent link: http://hdl.handle.net/10197/5347
Date: Mar-2005
Abstract: Scanning Kelvin probe microscopy (SKPM) and electrostatic force microscopy (EFM) have been employed to measure the surface potentials and the surface charge densities of the Ga- and the N-face of a GaN lateral polarity heterostructure (LPH). The surface was subjected to an HCl surface treatment to address the role of adsorbed charge on polarization screening. It has been found that while the Ga-face surface appears to be unaffected by the surface treatment, the N-face surface exhibited an increase in adsorbed screening charge density (1.6 +/- 0.5x10(10) cm(-2)), and a reduction of 0.3 +/- 0.1 V in the surface potential difference between the N- and Ga-face surfaces.
Type of material: Journal Article
Publisher: American Institute of Physics
Copyright (published version): 2005 American Institute of Physics
Keywords: Scanning Kelvin probe microscopy (SKPM);Electrostatic force microscopy
DOI: 10.1063/1.1869535
Language: en
Status of Item: Peer reviewed
Appears in Collections:Physics Research Collection

Show full item record

SCOPUSTM   
Citations 10

32
Last Week
1
Last month
checked on Jun 22, 2018

Page view(s) 50

41
checked on May 25, 2018

Download(s) 50

90
checked on May 25, 2018

Google ScholarTM

Check

Altmetric


This item is available under the Attribution-NonCommercial-NoDerivs 3.0 Ireland. No item may be reproduced for commercial purposes. For other possible restrictions on use please refer to the publisher's URL where this is made available, or to notes contained in the item itself. Other terms may apply.