Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors

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Title: Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors
Authors: Dehoff, C.
Rodriguez, Brian J.
Kingon, A. I.
et al.
Permanent link: http://hdl.handle.net/10197/5348
Date: Feb-2005
Abstract: This article describes an experimental setup for combined measurements of domain switching dynamics and switching currents in micrometer scale ferroelectric capacitors. The setup is based on a commercial atomic force microscope (AFM) that is equipped with a piezoresponse mode for domain imaging and with a wide bandwidth current amplifier for switching current recording. The setup allows combined domain/current measurements in capacitors as small as 1 mum(2) with switching times resolved down to 10 ns. The incorporation of switching current measurement capability into piezoresponse AFM makes detailed analysis of switching behavior in ferroelectric memory devices possible.
Type of material: Journal Article
Publisher: American Institute of Physics
Copyright (published version): 2005 American Institute of Physics
Keywords: Domain switching dynamics;Micrometer scale ferroelectric capacitors
DOI: 10.1063/1.1850652
Language: en
Status of Item: Peer reviewed
Appears in Collections:Physics Research Collection

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