Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors
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|Title:||Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors||Authors:||Dehoff, C.
Rodriguez, Brian J.
Kingon, A. I.
|Permanent link:||http://hdl.handle.net/10197/5348||Date:||Feb-2005||Abstract:||This article describes an experimental setup for combined measurements of domain switching dynamics and switching currents in micrometer scale ferroelectric capacitors. The setup is based on a commercial atomic force microscope (AFM) that is equipped with a piezoresponse mode for domain imaging and with a wide bandwidth current amplifier for switching current recording. The setup allows combined domain/current measurements in capacitors as small as 1 mum(2) with switching times resolved down to 10 ns. The incorporation of switching current measurement capability into piezoresponse AFM makes detailed analysis of switching behavior in ferroelectric memory devices possible.||Type of material:||Journal Article||Publisher:||American Institute of Physics||Copyright (published version):||2005 American Institute of Physics||Keywords:||Domain switching dynamics; Micrometer scale ferroelectric capacitors||DOI:||10.1063/1.1850652||Language:||en||Status of Item:||Peer reviewed|
|Appears in Collections:||Physics Research Collection|
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