Piezoresponse force microscopy for polarity imaging of GaN
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|Title:||Piezoresponse force microscopy for polarity imaging of GaN||Authors:||Rodriguez, Brian J.
Kingon, A. I.
|Permanent link:||http://hdl.handle.net/10197/5377||Date:||Jun-2002||Online since:||2014-02-06T11:57:09Z||Abstract:||The polarity distribution of GaN based lateral polarity heterostructures is investigated by piezoresponse force microscopy (PFM). Simultaneous imaging of surface morphology, as well as the phase and magnitude of the piezoelectric response, is performed by PFM on a GaN film with patterned polarities on a c-Al2O3 substrate. We demonstrate that the polarity distribution of GaN based lateral polarity heterostructures can be deduced from the phase image of the piezoresponse with nanometer scale spatial resolution.||Type of material:||Journal Article||Publisher:||American Institute of Physics||Journal:||Applied Physics Letters||Volume:||80||Issue:||22||Start page:||4166||End page:||4168||Copyright (published version):||2002 American Institute of Physics||Keywords:||Polarity distribution; Piezoresponse force microscopy; Piezoresponse response||DOI:||10.1063/1.1483117||Language:||en||Status of Item:||Peer reviewed|
|Appears in Collections:||Physics Research Collection|
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