Piezoresponse force microscopy for polarity imaging of GaN

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Title: Piezoresponse force microscopy for polarity imaging of GaN
Authors: Rodriguez, Brian J.
Gruverman, A.
Kingon, A. I.
et al.
Permanent link: http://hdl.handle.net/10197/5377
Date: Jun-2002
Online since: 2014-02-06T11:57:09Z
Abstract: The polarity distribution of GaN based lateral polarity heterostructures is investigated by piezoresponse force microscopy (PFM). Simultaneous imaging of surface morphology, as well as the phase and magnitude of the piezoelectric response, is performed by PFM on a GaN film with patterned polarities on a c-Al2O3 substrate. We demonstrate that the polarity distribution of GaN based lateral polarity heterostructures can be deduced from the phase image of the piezoresponse with nanometer scale spatial resolution.
Type of material: Journal Article
Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 80
Issue: 22
Start page: 4166
End page: 4168
Copyright (published version): 2002 American Institute of Physics
Keywords: Polarity distributionPiezoresponse force microscopyPiezoresponse response
DOI: 10.1063/1.1483117
Language: en
Status of Item: Peer reviewed
Appears in Collections:Physics Research Collection

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