Quantitative determination of tip parameters in piezoresponse force microscopy

Files in This Item:
File Description SizeFormat 
Kalinin_et_al_Appl_Phys_Lett_2007.pdf171.68 kBAdobe PDFDownload
Title: Quantitative determination of tip parameters in piezoresponse force microscopy
Authors: Kalinin, S. V.
Jesse, S.
Rodriguez, Brian J.
et al.
Permanent link: http://hdl.handle.net/10197/5475
Date: 24-May-2007
Abstract: One of the key limiting factors in the quantitative interpretation of piezoresponse force microscopy (PFM) is the lack of knowledge on the effective tip geometry. Here the authors derive analytical expressions for a 180 degrees domain wall profile in PFM for the point charge, sphere plane, and disk electrode models of the tip. An approach for the determination of the effective tip parameters from the wall profile is suggested and illustrated for several ferroelectric materials. The calculated tip parameters can be used self-consistently for the interpretation of PFM resolution and spectroscopy data, i.e., linear imaging processes.
Type of material: Journal Article
Publisher: American Institute of Physics
Keywords: Domain walls;Atomic force microscopy;Ferroelectric materials
DOI: 10.1063/1.2742900
Language: en
Status of Item: Peer reviewed
Appears in Collections:Physics Research Collection

Show full item record

SCOPUSTM   
Citations 10

24
Last Week
0
Last month
checked on Jun 23, 2018

Page view(s) 50

77
checked on May 25, 2018

Download(s) 50

55
checked on May 25, 2018

Google ScholarTM

Check

Altmetric


This item is available under the Attribution-NonCommercial-NoDerivs 3.0 Ireland. No item may be reproduced for commercial purposes. For other possible restrictions on use please refer to the publisher's URL where this is made available, or to notes contained in the item itself. Other terms may apply.