Quantitative determination of tip parameters in piezoresponse force microscopy

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Title: Quantitative determination of tip parameters in piezoresponse force microscopy
Authors: Kalinin, S. V.
Jesse, S.
Rodriguez, Brian J.
et al.
Permanent link: http://hdl.handle.net/10197/5475
Date: 24-May-2007
Online since: 2014-03-20T16:00:25Z
Abstract: One of the key limiting factors in the quantitative interpretation of piezoresponse force microscopy (PFM) is the lack of knowledge on the effective tip geometry. Here the authors derive analytical expressions for a 180 degrees domain wall profile in PFM for the point charge, sphere plane, and disk electrode models of the tip. An approach for the determination of the effective tip parameters from the wall profile is suggested and illustrated for several ferroelectric materials. The calculated tip parameters can be used self-consistently for the interpretation of PFM resolution and spectroscopy data, i.e., linear imaging processes.
Type of material: Journal Article
Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 90
Issue: 21
Start page: 212905
End page: 212905
Keywords: Domain wallsAtomic force microscopyFerroelectric materials
DOI: 10.1063/1.2742900
Language: en
Status of Item: Peer reviewed
Appears in Collections:Physics Research Collection

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