Dual harmonic Kelvin probe force microscopy at the graphene-liquid interface

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Title: Dual harmonic Kelvin probe force microscopy at the graphene-liquid interface
Authors: Collins, Liam
Kilpatrick, J. I.
Vlassiouk, Ivan V.
Weber, Stefan A. L.
Rodriguez, Brian J.
et al.
Permanent link: http://hdl.handle.net/10197/5564
Date: Apr-2014
Abstract: Kelvin probe force microscopy (KPFM) is a powerful technique for the determination of the contact potential difference (CPD) between an atomic force microscope tip and a sample under ambient and vacuum conditions. However, for many energy storage and conversion systems, including graphene-based electrochemical capacitors, understanding electrochemical phenomena at the solid¿liquid interface is paramount. Despite the vast potential to provide fundamental insight for energy storage materials at the nanoscale, KPFM has found limited applicability in liquid environments to date. Here, using dual harmonic (DH)-KPFM, we demonstrate CPD imaging of graphene in liquid. We find good agreement with measurements performed in air, highlighting the potential of DH-KPFM to probe electrochemistry at the graphene¿liquid interface.
Funding Details: Science Foundation Ireland
University College Dublin
Type of material: Journal Article
Publisher: American Institute of Physics
Copyright (published version): 2014 American Institute of Physics
Keywords: Graphene;Kelvin;Solid-liquid;Electrochemistry;Surface potential
DOI: 10.1063/1.4870074
Language: en
Status of Item: Peer reviewed
Appears in Collections:Physics Research Collection

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