Dual harmonic Kelvin probe force microscopy at the graphene-liquid interface
Files in This Item:
|Collins_et_al_Appl_Phys_Lett_104_133103_2014.pdf||1.02 MB||Adobe PDF||Download|
|Title:||Dual harmonic Kelvin probe force microscopy at the graphene-liquid interface||Authors:||Collins, Liam
Kilpatrick, J. I.
Vlassiouk, Ivan V.
Weber, Stefan A. L.
Rodriguez, Brian J.
|Permanent link:||http://hdl.handle.net/10197/5564||Date:||Apr-2014||Abstract:||Kelvin probe force microscopy (KPFM) is a powerful technique for the determination of the contact potential difference (CPD) between an atomic force microscope tip and a sample under ambient and vacuum conditions. However, for many energy storage and conversion systems, including graphene-based electrochemical capacitors, understanding electrochemical phenomena at the solid¿liquid interface is paramount. Despite the vast potential to provide fundamental insight for energy storage materials at the nanoscale, KPFM has found limited applicability in liquid environments to date. Here, using dual harmonic (DH)-KPFM, we demonstrate CPD imaging of graphene in liquid. We find good agreement with measurements performed in air, highlighting the potential of DH-KPFM to probe electrochemistry at the graphene¿liquid interface.||Funding Details:||Science Foundation Ireland
University College Dublin
|Type of material:||Journal Article||Publisher:||American Institute of Physics||Journal:||Applied Physics Letters||Volume:||104||Issue:||13||Start page:||133103||Copyright (published version):||2014 American Institute of Physics||Keywords:||Graphene; Kelvin; Solid-liquid; Electrochemistry; Surface potential||DOI:||10.1063/1.4870074||Language:||en||Status of Item:||Peer reviewed|
|Appears in Collections:||Physics Research Collection|
Show full item record
This item is available under the Attribution-NonCommercial-NoDerivs 3.0 Ireland. No item may be reproduced for commercial purposes. For other possible restrictions on use please refer to the publisher's URL where this is made available, or to notes contained in the item itself. Other terms may apply.