Dual harmonic Kelvin probe force microscopy at the graphene-liquid interface

Files in This Item:
File Description SizeFormat 
Collins_et_al_Appl_Phys_Lett_104_133103_2014.pdf1.02 MBAdobe PDFDownload
Title: Dual harmonic Kelvin probe force microscopy at the graphene-liquid interface
Authors: Collins, Liam
Kilpatrick, J. I.
Vlassiouk, Ivan V.
Weber, Stefan A. L.
Rodriguez, Brian J.
et al.
Permanent link: http://hdl.handle.net/10197/5564
Date: Apr-2014
Abstract: Kelvin probe force microscopy (KPFM) is a powerful technique for the determination of the contact potential difference (CPD) between an atomic force microscope tip and a sample under ambient and vacuum conditions. However, for many energy storage and conversion systems, including graphene-based electrochemical capacitors, understanding electrochemical phenomena at the solid¿liquid interface is paramount. Despite the vast potential to provide fundamental insight for energy storage materials at the nanoscale, KPFM has found limited applicability in liquid environments to date. Here, using dual harmonic (DH)-KPFM, we demonstrate CPD imaging of graphene in liquid. We find good agreement with measurements performed in air, highlighting the potential of DH-KPFM to probe electrochemistry at the graphene¿liquid interface.
Funding Details: Science Foundation Ireland
University College Dublin
Type of material: Journal Article
Publisher: American Institute of Physics
Journal: Applied Physics Letters
Volume: 104
Issue: 13
Start page: 133103
Copyright (published version): 2014 American Institute of Physics
Keywords: GrapheneKelvinSolid-liquidElectrochemistrySurface potential
DOI: 10.1063/1.4870074
Language: en
Status of Item: Peer reviewed
Appears in Collections:Physics Research Collection

Show full item record

Citations 20

Last Week
Last month
checked on Oct 11, 2018

Google ScholarTM



This item is available under the Attribution-NonCommercial-NoDerivs 3.0 Ireland. No item may be reproduced for commercial purposes. For other possible restrictions on use please refer to the publisher's URL where this is made available, or to notes contained in the item itself. Other terms may apply.