Nanoscale characterization of β-phase HxLi1−xNbO3 layers by piezoresponse force microscopy
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|Title:||Nanoscale characterization of β-phase HxLi1−xNbO3 layers by piezoresponse force microscopy||Authors:||Manzo, Michele
Rodriguez, Brian J.
|Permanent link:||http://hdl.handle.net/10197/5891||Date:||2014||Abstract:||We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO3 with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d 33 coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 ± 2% and 68 ± 3% of the LiNbO3 value, for undoped and 5 mol. % MgO-doped substrates, respectively.||Funding Details:||Science Foundation Ireland||Type of material:||Journal Article||Publisher:||American Institute of Physics||Copyright (published version):||2014 AIP Publishing LLC||Keywords:||Atomic force microscopy;Polarisation;Protons;Refractive index;Ferroelectric substrates||DOI:||10.1063/1.4891352||Language:||en||Status of Item:||Peer reviewed|
|Appears in Collections:||Physics Research Collection|
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