Nanoscale characterization of β-phase HxLi1−xNbO3 layers by piezoresponse force microscopy

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Title: Nanoscale characterization of β-phase HxLi1−xNbO3 layers by piezoresponse force microscopy
Authors: Manzo, Michele
Denning, Denise
Rodriguez, Brian J.
Gallo, Katia
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Date: 2014
Online since: 2014-09-24T08:27:50Z
Abstract: We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO3 with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d 33 coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 ± 2% and 68 ± 3% of the LiNbO3 value, for undoped and 5 mol. % MgO-doped substrates, respectively.
Funding Details: Science Foundation Ireland
Type of material: Journal Article
Publisher: American Institute of Physics
Journal: Journal of Applied Physics
Volume: 116
Issue: 066815
Copyright (published version): 2014 AIP Publishing LLC
Keywords: Atomic force microscopyPolarisationProtonsRefractive indexFerroelectric substrates
DOI: 10.1063/1.4891352
Language: en
Status of Item: Peer reviewed
Appears in Collections:Physics Research Collection

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