Nanoscale characterization of β-phase HxLi1−xNbO3 layers by piezoresponse force microscopy
Files in This Item:
|Manzo_et_al_J_Appl_Phys_2014.pdf||1.79 MB||Adobe PDF||Download|
|Title:||Nanoscale characterization of β-phase HxLi1−xNbO3 layers by piezoresponse force microscopy||Authors:||Manzo, Michele
Rodriguez, Brian J.
|Permanent link:||http://hdl.handle.net/10197/5891||Date:||2014||Online since:||2014-09-24T08:27:50Z||Abstract:||We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO3 with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d 33 coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 ± 2% and 68 ± 3% of the LiNbO3 value, for undoped and 5 mol. % MgO-doped substrates, respectively.||Funding Details:||Science Foundation Ireland||Type of material:||Journal Article||Publisher:||American Institute of Physics||Journal:||Journal of Applied Physics||Volume:||116||Issue:||066815||Copyright (published version):||2014 AIP Publishing LLC||Keywords:||Atomic force microscopy; Polarisation; Protons; Refractive index; Ferroelectric substrates||DOI:||10.1063/1.4891352||Language:||en||Status of Item:||Peer reviewed|
|Appears in Collections:||Physics Research Collection|
Show full item record
This item is available under the Attribution-NonCommercial-NoDerivs 3.0 Ireland. No item may be reproduced for commercial purposes. For other possible restrictions on use please refer to the publisher's URL where this is made available, or to notes contained in the item itself. Other terms may apply.