Band excitation Kelvin probe force microscopy utilizing photothermal excitation
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|Collins_et_al_Appl_Phys_Lett_106_104102_2015.pdf||1.74 MB||Adobe PDF||Download|
|Title:||Band excitation Kelvin probe force microscopy utilizing photothermal excitation||Authors:||Collins, Liam
Rodriguez, Brian J.
|Permanent link:||http://hdl.handle.net/10197/6479||Date:||2015||Online since:||2015-04-14T10:08:39Z||Abstract:||A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizingphotothermal as opposed to electrical excitation is developed. Photothermal band excitation (PthBE)-KPFM is implemented here in a grid mode on a model test sample comprising a metal-insulator junction with local charge-patterned regions. Unlike the previously described open loop BE-KPFM, which relies on capacitive actuation of the cantilever, photothermal actuation is shown to be highly sensitive to the electrostatic force gradient even at biases close to the contact potential difference (CPD). PthBE-KPFM is further shown to provide a more localized measurement of true CPD in comparison to the gold standard ambient KPFM approach, amplitude modulated KPFM. Finally, PthBE-KPFM data contain information relating to local dielectric properties and electronic dissipation between tip and sample unattainable using conventional single frequency KPFM approaches||Type of material:||Journal Article||Publisher:||American Institute of Physics||Journal:||Applied Physics Letters||Volume:||106||Keywords:||CPD mapping; Kelvin probe force microscopy (KPFM)||DOI:||10.1063/1.4913910||Language:||en||Status of Item:||Peer reviewed|
|Appears in Collections:||Physics Research Collection|
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