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Band excitation Kelvin probe force microscopy utilizing photothermal excitation
Date Issued
2015
Date Available
2015-04-14T10:08:39Z
Abstract
A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizingphotothermal as opposed to electrical excitation is developed. Photothermal band excitation (PthBE)-KPFM is implemented here in a grid mode on a model test sample comprising a metal-insulator junction with local charge-patterned regions. Unlike the previously described open loop BE-KPFM, which relies on capacitive actuation of the cantilever, photothermal actuation is shown to be highly sensitive to the electrostatic force gradient even at biases close to the contact potential difference (CPD). PthBE-KPFM is further shown to provide a more localized measurement of true CPD in comparison to the gold standard ambient KPFM approach, amplitude modulated KPFM. Finally, PthBE-KPFM data contain information relating to local dielectric properties and electronic dissipation between tip and sample unattainable using conventional single frequency KPFM approaches
Other Sponsorship
Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. DOE
Type of Material
Journal Article
Publisher
American Institute of Physics
Journal
Applied Physics Letters
Volume
106
Language
English
Status of Item
Peer reviewed
This item is made available under a Creative Commons License
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Name
Collins_et_al_Appl_Phys_Lett_106_104102_2015.pdf
Size
1.7 MB
Format
Owning collection
Scopus© citations
18
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