Crack detection limits in unit based masonry with terrestrial laser scanning

Files in This Item:
File Description SizeFormat 
2013NDT.pdf1.04 MBAdobe PDFDownload
Title: Crack detection limits in unit based masonry with terrestrial laser scanning
Authors: Laefer, Debra F.
Truong-Hong, Linh
Carr, Hamish
Singh, Manmeet
Permanent link: http://hdl.handle.net/10197/7446
Date: Mar-2014
Abstract: This paper presents the fundamental mathematics to determine the minimum crack width detectable with a terrestrial laser scanner in unit-based masonry. Orthogonal offset, interval scan angle, crack orientation, and crack depth are the main parameters. The theoretical work is benchmarked against laboratory tests using 4 samples with predesigned crack widths of 1–7 mm scanned at orthogonal distances of 5.0–12.5 m and at angles of 0°–30°. Results showed that absolute errors of crack width were mostly less than 1.37 mm when the orthogonal distance varied 5.0–7.5 m but significantly increased for greater distances. The orthogonal distance had a disproportionately negative effect compared to the scan angle.
Funding Details: European Research Council
Science Foundation Ireland
Type of material: Journal Article
Publisher: Elsevier
Copyright (published version): 2013 Elsevier
Keywords: Terrestrial laser scanning;Point cloud data;Crack detection;Structural health monitoring;Condition assessment;Masonry
DOI: 10.1016/j.ndteint.2013.11.001
Language: en
Status of Item: Peer reviewed
Appears in Collections:Earth Institute Research Collection
Civil Engineering Research Collection

Show full item record

SCOPUSTM   
Citations 20

19
Last Week
1
Last month
checked on Jun 22, 2018

Download(s) 50

118
checked on May 25, 2018

Google ScholarTM

Check

Altmetric


This item is available under the Attribution-NonCommercial-NoDerivs 3.0 Ireland. No item may be reproduced for commercial purposes. For other possible restrictions on use please refer to the publisher's URL where this is made available, or to notes contained in the item itself. Other terms may apply.