Applications of piezoresponse force microscopy in materials research: from inorganic ferroelectrics to biopiezoelectrics and beyond

Files in This Item:
 File SizeFormat
Downloaddenning_pfm_review_repository.pdf44.67 MBAdobe PDF
Title: Applications of piezoresponse force microscopy in materials research: from inorganic ferroelectrics to biopiezoelectrics and beyond
Authors: Denning, DeniseGuyonnet, JillRodriguez, Brian J.
Permanent link: http://hdl.handle.net/10197/7600
Date: Feb-2016
Online since: 2017-02-25T02:00:14Z
Abstract: Piezoresponse force microscopy (PFM) probes the mechanical deformation of a sample in response to an electric field applied with the tip of an atomic force microscope. Originally developed more than two decades ago to study ferroelectric materials, this technique has since been used to probe electromechanical functionality in a wide range of piezoelectric materials including organic and biological systems. Piezoresponse force microscopy has also been demonstrated as a useful tool to detect mechanical strain originating from electrical phenomena in non-piezoelectric materials. Parallelling advances in analytical and numerical modelling, many technical improvements have been made in the last decade: switching spectroscopy PFM allows the polarisation switching properties of ferroelectrics to be resolved in real space with nanometric resolution, while dual ac resonance tracking and band excitation PFM have been used to improve the signal-to-noise ratio. In turn, these advances have led to increasingly large multidimensional data sets containing more complete information on the properties of the sample studied. In this review, PFM operation and calibration are described, and recent advances in the characterisation of electromechanical coupling using PFM are presented. The breadth of the systems covered highlights the versatility and wide applicability of PFM in fields as diverse as materials engineering and nanomedicine. In each of these fields, combining PFM with complementary techniques is key to develop future insight into the intrinsic properties of the materials as well as for device applications.
Funding Details: Science Foundation Ireland
Funding Details: Swiss National Science Foundation
Type of material: Journal Article
Publisher: Taylor and Francis
Journal: International Materials Reviews
Volume: 61
Issue: 1
Start page: 46
End page: 70
Copyright (published version): 2016 Taylor and Francis
Keywords: Piezoresponse force microscopyPiezoelectricityFerroelectricityAtomic force microscopyElectrochemical strain microscopyBiomaterialsEnergy materials
DOI: 10.1179/1743280415Y.0000000013
Language: en
Status of Item: Peer reviewed
This item is made available under a Creative Commons License: https://creativecommons.org/licenses/by-nc-nd/3.0/ie/
Appears in Collections:Conway Institute Research Collection
Physics Research Collection

Show full item record

SCOPUSTM   
Citations 10

42
Last Week
1
Last month
checked on Sep 11, 2020

Page view(s) 20

1,893
Last Week
2
Last month
18
checked on Jun 28, 2022

Download(s) 50

571
checked on Jun 28, 2022

Google ScholarTM

Check

Altmetric


If you are a publisher or author and have copyright concerns for any item, please email research.repository@ucd.ie and the item will be withdrawn immediately. The author or person responsible for depositing the article will be contacted within one business day.