A 1/f noise up-conversion reduction technique for voltage-biased RF CMOS oscillators

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Title: A 1/f noise up-conversion reduction technique for voltage-biased RF CMOS oscillators
Authors: Shahmohammadi, Mina
Babaie, Masoud
Staszewski, Robert Bogdan
Permanent link: http://hdl.handle.net/10197/8433
Date: Nov-2016
Online since: 2017-04-18T15:05:47Z
Abstract: In this paper, we propose a method to reduce a flicker (1/f) noise upconversion in voltage-biased RF oscillators. Excited by a harmonically rich tank current, a typical oscillation voltage waveform is observed to have asymmetric rise and fall times due to even-order current harmonics flowing into the capacitive part, as it presents the lowest impedance path. The asymmetric oscillation waveform results in an effective impulse sensitivity function of a nonzero dc value, which facilitates the 1/f noise upconversion into the oscillator's 1/f3 phase noise. We demonstrate that if the ω0 tank exhibits an auxiliary resonance at 2ω0, thereby forcing this current harmonic to flow into the equivalent resistance of the 2ω0 resonance, then the oscillation waveform would be symmetric and the flicker noise upconversion would be largely suppressed. The auxiliary resonance is realized at no extra silicon area in both inductor-and transformer-based tanks by exploiting different behaviors of inductors and transformers in differential-and common-mode excitations. These tanks are ultimately employed in designing modified class-D and class-F oscillators in 40 nm CMOS technology. They exhibit an average flicker noise corner of less than 100 kHz.
Funding Details: European Research Council
Type of material: Journal Article
Publisher: IEEE
Journal: IEEE Journal of Solid-State Circuits
Volume: 51
Issue: 11
Start page: 2610
End page: 2624
Copyright (published version): 2016 IEEE
Keywords: Class-D oscillatorClass-F oscillatorDigitally controlled oscillatorFlicker noiseFlicker noise upconversionImpulse sensitivity function (ISF)Phase noise (PN)Voltage-biasedRF oscillator
DOI: 10.1109/JSSC.2016.2602214
Language: en
Status of Item: Peer reviewed
Appears in Collections:Electrical and Electronic Engineering Research Collection

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