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Measuring optical phase digitally in coherent metrology systems
Date Issued
2017-04-09
Date Available
2017-07-31T14:58:29Z
Abstract
The accurate measurement of optical phase has many applications in metrology. For biological samples, which appear transparent, the phase data provides information about the refractive index of the sample. In speckle metrology, the phase can be used to estimate stress and strains of a rough surface with high sensitivity. In this theoretical manuscript we compare and contrast the properties of two techniques for estimating the phase distribution of a wave field under the paraxial approximation: (I) A digital holographic system, and (II) An idealized phase retrieval system. Both systems use a CCD or CMOS array to measure the intensities of the wave fields that are reflected from or transmitted through the sample of interest. This introduces a numerical aspect to the problem. For the two systems above we examine how numerical calculations can limit the performance of these systems leading to a near-infinite number of possible solutions.
Sponsorship
Science Foundation Ireland
Other Sponsorship
Insight Research Centre
Type of Material
Conference Publication
Publisher
Society of Photo-optical Instrumentation Engineers (SPIE)
Journal
in SPIE , Anaheim, California, United States
Volume
Defense + Commercial Sensing
Copyright (Published Version)
2017 Society of Photo-Optical Instrumentation Engineers (SPIE)
Language
English
Status of Item
Peer reviewed
Part of
Harding, K.G. and Zhang, S. (eds.) Conference Volume 10220: Proc. SPIE 10220 Dimensional Optical Metrology and Inspection for Practical Applications VI
Conference Details
Dimensional Optical Metrology and Inspection for Practical Applications VI, Anaheim, California, United States of America, 9 April 2017
This item is made available under a Creative Commons License
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