Now showing 1 - 3 of 3
  • Publication
    Micro-Raman study of electronic properties of inversion domains in GaN-based lateral polarity heterostructures
    (American Institute of Physics, 2003-06) ; ; ;
    The electronic properties of inversion domains in a GaN-based lateral polarity heterostructure were investigated using micro-Raman spectroscopy. The piezoelectric polarization of each domain was calculated from strain determined via Raman scattering. The free carrier concentration and electron mobility were deduced from the longitudinal optical phonon-plasmon coupled mode. The electron concentration in the N-face domain was slightly higher than that in the Ga-face domain. It appears that during growth, a larger number of donor impurities may have been incorporated into the N-face domain than into the Ga-face domain.
    Scopus© Citations 35  501
  • Publication
    Wavelength-dependent Raman scattering of hydrogenated amorphous silicon carbon with red, green, and blue light excitation
    (Cambridge University Press, 2003-04) ; ; ; ;
    This study presents results of wavelength-dependent Raman scattering from amorphous silicon carbon (a-Si:C:H). The a-Si:C:H films were produced by radio-frequency plasma-enhanced chemical vapor deposition. Prior results with amorphous carbon indicate that laser excitation selectively probes clusters with differing sizes. Our measurements with a-Si:C:H indicate that when using red (632.8 nm), green (514.5 nm), and blue (488.0 nm) excitation, the Raman D and G peaks shift to higher wave numbers as the excitation energy increases. The higher frequency is associated with smaller clusters that are preferentially excited with higher photon energy. It appears that photoluminescence occurs due to radiative recombination from intracluster transitions in Si-alloyed sp(2)-bonded carbon clusters.
      364Scopus© Citations 1
  • Publication
    Photoelectron emission microscopy observation of inversion domain boundaries of GaN-based lateral polarity heterostructures
    (American Institute of Physics, 2003-11) ; ; ;
    An intentionally grown GaN film with laterally patterned Ga- and N-face polarities is studied using in situ UV-photoelectron emission microscopy (PEEM). Before chemical vapor cleaning of the surface, the emission contrast between the Ga- and N-face polarities regions was not significant. However, after cleaning the emission contrast between the different polarity regions was enhanced such that the N-face regions exhibited increased emission over the Ga-face regions. The results indicate that the emission threshold of the N-face region is lower than that of the Ga face. Moreover, bright emission was detected from regions around the inversion domain boundaries of the lateral polarity heterostructure. The PEEM polarity contrast and intense emission from the inversion domain boundary regions are discussed in terms of the built-in lateral field and the surface band bending induced by the polarization bound surface charges.
    Scopus© Citations 36  468