Watanabe, TakayukiTakayukiWatanabeFunakubo, HiroshiHiroshiFunakuboOsada, MinoruMinoruOsadaRodriguez, Brian J.Brian J.Rodriguezet al.2014-01-092014-01-092007, Amer2007-03-16Applied Physics Lettershttp://hdl.handle.net/10197/5225The authors report on an approach to establish intrinsic polarization properties in bismuth-layered ferroelectric films by piezoelectric coefficient and soft-mode spectroscopy, as well as by a direct polarization-electric field hysteresis. In epitaxially grown (Bi4−xNdx)Ti3O12 (0⩽x⩽0.73)films, they show that these complementary characterizations can phenomenologically and thermodynamically represent the intrinsic polarization states in (Bi4−xNdx)Ti3O12films, and the intrinsic Ps of 67μC/cm2 is estimated for pure Bi4Ti3O12, superior to 50μC/cm2 in bulk single crystal. Their results provide a pathway to draw full potential in ferroelectric thin films.enThe following article appeared in Applied Physics Letters, 90 (11) : 112914 and may be found at http://link.aip.org/link/doi/10.1063/1.2713858. The article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.Piezoelectric coefficientSoft-mode spectroscopyPolarization statesJournal Article901111291410.1063/1.27138582013-11-22https://creativecommons.org/licenses/by-nc-nd/3.0/ie/