Suzuki, C.C.SuzukiKato, T.T.KatoSakaue, H.A.H.A.SakaueKato, D.D.KatoMurakami, I.I.MurakamiSato, K.K.SatoTamura, N.N.TamuraSudo, S.S.SudoYamamoto, N.N.YamamotoTanuma, H.H.TanumaOhashi, H.H.OhashiD'Arcy, RebekahRebekahD'ArcyHarte, Colm S.Colm S.HarteO'Sullivan, GerryGerryO'Sullivan2012-06-262012-06-262011 Ameri2010-09-21http://hdl.handle.net/10197/37087th International Conference On Atomic and Molecular Data and Their Applications - ICAMDATA-2010, 21–24 September 2010, Vilnius, (Lithuania)Extreme ultra-violet (EUV) emission spectra from highly charged tin, xenon and tungsten ions have been measured in optically thin high-temperature plasmas produced in the Large Helical Device (LHD) at the National Institute for Fusion Science by using a grazing incidence spectrometer and a tracer-encapsulated solid pellet (TESPEL) injector. Quasi-continuous spectral features arising from unresolved transition array (UTA) of open 4d subshell ions were commonly observed for tin, xenon and tungsten around 13.5, 11, and 5 nm, respectively, when edge plasma was cooled enough. The spectral appearance obviously depends on edge electron temperature and atomic number. In the case of intermediate edge temperature, sharp discrete lines from highly charged open 4s or 4p subshell ions are clearly observed for tin and xenon in longer wavelength side of the UTAs but not for tungsten. Assignments of the strong discrete lines have been performed with the help of comparisons with the other experimental data and the theoretical calculations by Cowan code. Contribution of open 4f subshell ions should also be considered to interpret the whole spectra from tungsten ions.702001 bytesapplication/pdfenThe following article appeared in AIP Conf. Proc. 1344, pp. 21-30 and may be found at http://dx.doi.org/10.1063/1.3585803. The article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.LHDHigh Z elementsEUV spectraHighly charged ionsTinXenonTungstenUltraviolet spectraSpectrum analysisTinXenonTungstenMeasurement of EUV spectra from high Z elements in the Large Helical DeviceConference Publication10.1063/1.3585803https://creativecommons.org/licenses/by-nc-sa/1.0/