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  5. Coherent imaging of periodic thick fine isolated structures
 
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Coherent imaging of periodic thick fine isolated structures

Author(s)
Sheridan, John T.  
Sheppard, Colin  
Uri
http://hdl.handle.net/10197/3288
Date Issued
1993-04-01
Date Available
2011-11-03T15:21:05Z
Abstract
The diffraction orders and coherent bright and dark field images produced by isolated steps and grooves (notches and trenches) are examined. The isolated structures are approximated by means of a grating with a
large period that contains small, widely separated, lamellar structures. The rigorous modal method for TE polarized incident light is used for the numerical calculations. Structures in two types of dielectric material, refractive index n = 1.5 and n = 4.0, are discussed. The images are examined for variations with several parameters, including width and thickness of the structure and focus position. Several approximate methods for calculating these images, based on first-order approximations, are suggested.
Sponsorship
Other funder
Other Sponsorship
The British Council
The Prendergast Fund
Jesus College, University of Oxford
Type of Material
Journal Article
Publisher
Optical Society of America
Journal
Journal of the Optical Society of America A
Volume
10
Issue
4
Start Page
614
End Page
632
Copyright (Published Version)
1993 Optical Society of America
Subject – LCSH
Dielectrics
Diffraction
Microscopy
DOI
10.1364/JOSAA.10.000614
Web versions
http://dx.doi.org/10.1364/JOSAA.10.000614
Language
English
Status of Item
Not peer reviewed
ISSN
1084-7529 (print)
1520-8532 (online)
This item is made available under a Creative Commons License
https://creativecommons.org/licenses/by-nc-sa/1.0/
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Coherent imaging of periodic thick fine isolated structures.pdf

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Owning collection
Electrical and Electronic Engineering Research Collection

Item descriptive metadata is released under a CC-0 (public domain) license: https://creativecommons.org/public-domain/cc0/.
All other content is subject to copyright.

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